Electrical Characterization Lab

The following instruments are available:

• Suss PM5HF Analytical Probe System for DC and HF electrical measurements of samples up to 6 inches;
  
  
• A second probe station for flexible substrates devices measurements;
  
  
• A variable Temperature Micro-Probe System by MMR Technologies for electrical measurements of devices in vacuum in a temperature range of 80-580K;

• Semicondutor Parameter Analyzer HP4145B for Dc electrical characteristics;
  
  
• UV PERKIN ELMER Lambda35 Spectrometer;
  
  
• FTIR PERKIN ELMER Spectrum 1000;
  
  
• Keithley 236 Source measure unit.
  
  

Staff Contact: Massimo Cuscuna', Luca Maiolo, Luigi Mariucci, Alessandro Pecora, Matteo Rapisarda, Daniela Simeone, Antonio Valletta.

Optoelectronic Lab

Optoelectronic laboratory is dedicated to photonic and liquid crystal devices characterisation, equipped with:

• Optical microscope (50x - 500x) with long working distance objective, digital photo and video cameras; the microscopes operates in transmission, reflection, polarized light, bright and dark and interference field (Nomarski technique) and conoscopy (Bertrand lens);
  
  
• Calibrated graded retardation plates (Berek)for measurements of optical retardation (Leica);
  
  
• Optical bench;
  
  
• Hot stage (up to 250 °C) for microscope and bench use;
  
  
• Fiber optics spectrophotometer for UV-VIS light, soon to be expanded to IR (<900 nm), for microscope and bench use;
  
  
• Computer controlled precision translation and rotating stage setup;
  
  
• Manually controlled translation and rotation stage system;
  
  
• Solid state and He-Ne lasers;
  
  
• Incoherent visible and UV light sources;
  
  
• 500 Mhz, 4 channel, long memory digital sampling oscilloscope (LeCroy Waverunner 6050).
  
  

Staff Contact: Romeo Beccherelli

Sensor Lab

The laboratory activities are performed within two fume cupboard where chemical and biochemical sensor features toward gases and volatile organic compounds (VOCs) are investigated. They take in respectively:

• Two equipments of 4-channel readout MKS 247 Mass Flow Controllers in order to guide and dilute analytes throughout suitable measurement chambers;
  
  
• Two incubators (G-cell 075 and Stuart S160D) having different performances, are able to control and modulate environmental temperature of headspace and measurement chamber;
  
  
• A home-made electrospinning set-up (GW GPC-3030D and HQ Power P5230023 power supplies) is able to create nanofibrous structures;
  
  
• Chemical precursors can be weighted by Sartorius Basic balance;
  
  
• Polymer blends and/or solutions are mixed above two hot-plate stirrers (Stuart and Heidolph MR3002) and the polymer solution viscosity is measured by a viscosimeter (Visco Basic Plus Fungilab);
  
  
• An Optical microscope (Euromex-Holland), equipped of a digital camera (C-MEX) is used for an early morphological survey of the chemical layers;
  
  
• Electrical signals of sensors are measured by Electrometers (Keitheley6517A and 595 Quasistatic CV meter) and multimeters interfaced to PCs.

Staff Contact: Antonella Macagnano

Applied Electronics Lab

The applied electronic lab focuses on design and test of programmable logics and full electronic boards. It also provides support to the institute activities regarding the electrical measurements and characterization of failure of devices and components.

Staff Contact: Emiliano Zampetti.

Millimetre and Microwave Design and Test Lab

Microwave design and testing is supported by a LAN realized by a server and graphical workstations, and remotely controlled measurement setups.
General purpose and commercial software is available or utilized in agreement with industrial partners, like:

• MSW, purposely written and implemented FORTRAN77 program for the frequency dependence of the electrical and dispersive quantities of magnetostatic volume wave devices and their graphical representation;
  
  
• AUTOCAD for mask design, ADS for circuit simulations and Applied Wave Research - Microwave Office;
  
  
• Applied Wave Research - Microwave Office;
  
  
• Comsol Multiphysics for electro-mechanics and electromagnetic simulations;
  
  
• FORTRAN, MATHCAD and MATLAB for general purpose computations and graphics;
  
  
• Agilent VEE for instrumentations remote control.

Microwave test equipment is available for:

Microwave magnetic devices characterization by means of a remotely controlled

• Ferromagnetic Resonance (FMR) waveguide equipment (magnetic materials line-width measurements at 9.25 GHz in a TE102 cavity);
  
  
• HP Spectrum Analyzer up to 22 GHz , for spectral measurements (phase noise, non-linear effects, …)
  
  
• HP8510C Vector Network Analyzer for S-parameter measurement up to 18 GHz.
  
  

Staff Contact: Giorgio de Angelis, Andrea Lucibello, Romolo Marcelli

Millimetre and Microwave Materials and Process Lab

Magnetic films growth and material processing can be performed in the lab equipped with:

• Two vertical furnaces for LPE of magnetic films, temperature controlled and with automatic dipping and movements of the substrates;
  
  
• Horizontal furnace for materials thermal annealing;
  
  
• Logitech machine for materials lapping and optical polishing;
  
  
• Kulicke & Soffa precision dicing machine (mechanical movement precision close to 1 µm) with 4" porous chuk, for allumina, silicon and garnet films cutting.
  
  
  

Staff Contact: Antonio Lampasona, Marco Maiani, Claudio Risi, Romolo Marcelli

Material Electrical Characterization Lab

• Digital Voltage Source Keithley k230;
  
  
• Digital Current Source;
  
  
• Quasi-static CV meter;
  
  
• CV meter;
  
  
• MKS Mass Flow Controller;
  
  
• Keithley 6517A Electrometer;
  
  
• Keithley 2001 Multimeter;
  
  
• Hewlet Packard Multimeter;
  
  
• Hewlet Packard Digital Oscilloscope;
  
  
• Keithley 199 DMM Scanner;
  
  
• Hewlet Packard Dynamic Signal Analyzer;
  
  
• EG&G Lock in Amplifier;
  
  
• Stanford Research Low Noise Amplifier;
  
  
• Stanford Research Synthetized Function Generator;
  
  
• Spectra Physics Laser;
  
  
• MEMMERT Vertical Furnace;
  
  
• Memmert Oven;
  
  
• Vacuum Bell for electrical sensors characterization avoiding interfering gases.
  
  
  
  

Staff Contact: Andrea Bearzotti