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Secondary ion mass spectrometry characterization of deuterated GaAsN films on GaAs

Type: 
Conference
Description: 
Secondary ion mass spectrometry characterization of deuterated GaAsN films on GaAs / D. Giubertoni; E. Iacob; M. Bersani; M. Anderle; R. Trotta; A. Polimeni; M. Capizzi; F. Martelli; S. Rubini. - (2009). ((Intervento presentato al convegno SIMS XVII - 17th International Conference on Secondary Ion Mass Spectrometry tenutosi a Toronto, Canada nel da 09/14/2009 a 09/18/2009 … Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte di FBK.
Publisher: 
Publication date: 
1 Jan 2009
Authors: 

Damiano Giubertoni, Erica Iacob, Massimo Bersani, Mariano Anderle, R Trotta, A Polimeni, M Capizzi, F Martelli, S Rubini

Biblio References: 
Origin: 
SIMS XVII-17th International Conference on Secondary Ion Mass Spectrometry
Link: 
https://cris.fbk.eu/handle/11582/20089

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