Type:
Journal
Description:
Subject: 36 MATERIALS SCIENCE; ATOMIC FORCE MICROSCOPY; DOMAIN STRUCTURE; ELECTRON DIFFRACTION; FERROMAGNETIC MATERIALS; FERROMAGNETIC RESONANCE; FERROMAGNETISM; GALLIUM NITRIDES; INTERFACES; IRON; MAGNETIC PROPERTIES; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS; SURFACE PROPERTIES; SURFACES; X-RAY DIFFRACTION
Publisher:
Publication date:
1 Jul 2005
Biblio References:
Volume: 40
Origin:
Verhandlungen der Deutschen Physikalischen Gesellschaft