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Type: 
Journal
Description: 
We study the excitation wavelength dependence of the Raman spectra of InN nanowires. The E_1(\rmLO) phonon mode, which is detected in backscattering configuration because of light entering through lateral faces, exhibits an upward fre‐quency shift that can be explained by Martin's double resonance. The E_1(\rmLO)/E_2^h intensity ratio increases with the excitation wavelength more rapidly than the A_1(\rmLO)/E_2^h ratio measured in InN thin films.(© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
Publisher: 
WILEY‐VCH Verlag
Publication date: 
1 Apr 2012
Authors: 

Núria Domènech‐Amador, Ramón Cuscó, R Calarco, T Yamaguchi, Y Nanishi, Lluís Artús

Biblio References: 
Volume: 6 Issue: 4 Pages: 160-162
Origin: 
physica status solidi (RRL)–Rapid Research Letters