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Type: 
Journal
Description: 
The effects of hot carriers and self-heating on the electrical stability of p-channel TFTs have been analysed combining experimental data and numerical simulations. While hot carrier effects were shown not to induce appreciable degradation, self-heating related instability was found to more seriously affect the device characteristics. New models have been developed to explain the reported results.
Publisher: 
The Korean Infomation Display Society
Publication date: 
1 Jan 2007
Authors: 
Biblio References: 
Pages: 1065-1070
Origin: 
한국정보디스플레이학회: 학술대회논문집