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Type: 
Journal
Description: 
The paper presents an experimental method useful to characterize on-wafer a four-port circuit, using a two-port VNA (Vector Network Analyzer). As an example, the method is applied for a coupler. The results obtained by using this method and the expected results obtained by simulation are in good agreement.
Publisher: 
Publication date: 
1 Jan 2009
Authors: 

Stefan Simion, Romolo Marcelli, Gheorghe Sajin, Giancarlo Bartolucci, Florea Craciunoiu

Biblio References: 
Volume: 12 Issue: 3 Pages: 394-401
Origin: 
SCIENCE AND TECHNOLOGY