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Type: 
Conference
Description: 
A digital holographic microscope (DHM) is employed as non-invasive metrological tool for inspection and characterization of a micromechanical shunt switches in coplanar waveguide configuration (CPW) for microwave applications. The switch is based on a bridge that can be actuated by using electrodes positioned laterally with respect to the central conductor of the CPW. The DHM features, such as speed, contact-less and non-destructivity, have allowed a full characterization of an electrical actuated shunt switches. In particular, the out-of-plane deformation of the bridge due to the applied voltage has been investigated with high accuracy. DHM inspection allows to investigate the shape of the bridge during the actuation, the total warpage due to the actuation, possible residual gap, possible hysteresis, and so on. These characterizations have been carried out both in static and in dynamic condition. In full paper …
Publisher: 
International Society for Optics and Photonics
Publication date: 
26 Aug 2005
Authors: 

Valerio Striano, Giuseppe Coppola, Pietro Ferraro, Domenico Alfieri, Sergio De Nicola, Andrea Finizio, Giovanni Pierattini, Romolo Marcelli, Paolo Mezzanotte

Biblio References: 
Volume: 5858 Pages: 585815
Origin: 
Nano-and Micro-Metrology