Publisher’s Note:“High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors”[Rev. Sci. Instrum. 87, 044702 (2016)]

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Publisher’s Note:“High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors”[Rev. Sci. Instrum. 87, 044702 (2016)]

Type:

Journal

Description:

This article was originally published online on 5 April 2016 with the fourth author’s name misspelled as “M. Rapisada”. It should have been spelled “M. Rapisarda”. The name appears correctly above. All online versions of the article were corrected on 21 April 2016; the article is correct as it appears in the printed version of the journal.

Publisher:

AIP Publishing LLC

Publication date:

18 May 2016

Authors:

G Giusi, O Giordano, G Scandurra, M Rapisarda, S Calvi, C Ciofi

Biblio References:

Volume: 87 Issue: 5 Pages: 059902

Origin:

Review of Scientific Instruments

Link:

https://aip.scitation.org/doi/pdf/10.1063/1.4950949

Publisher’s Note:“High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors”[Rev. Sci. Instrum. 87, 044702 (2016)]

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Publisher&#8217;s Note:&#8220;High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors&#8221;[Rev. Sci. Instrum. 87, 044702 (2016)]

Scientific Productions

Units in Italy

Contact info

Publisher’s Note:“High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors”[Rev. Sci. Instrum. 87, 044702 (2016)]