Antonio VALLETTA graduated from the "Università di Roma La Sapienza", in 1997. His final year's work was on the "Structure characterization of high Tc supercondutors by X-ray diffraction". In 1999 he joined the "Istituto di Elettronica dello Stato Solido", in Rome. In 2003 he received the PhD degree in Physics from the "Università degli Studi Roma Tre", Rome. His PhD thesis was on the "Analysis and characterization of polycrystalline silicon TFT's", with a special attention to short channel effects and drain field engineering trough advanced device architectures. From November 2007, he moved to IMM where he works as researcher. His current research interests include the modeling, simulation and physics of polycrystalline silicon and organic TFT's.